• DocumentCode
    802881
  • Title

    Temperature of laser-cooled /sup 171/Yb/sup +/ ions and application to a microwave frequency standard

  • Author

    Warrington, R. Bruce ; Fisk, Peter T H ; Wouters, Michael J. ; Lawn, Malcolm A.

  • Author_Institution
    Nat. Meas. Lab., CSIRO, Sydney, NSW, Australia
  • Volume
    49
  • Issue
    8
  • fYear
    2002
  • Firstpage
    1166
  • Lastpage
    1174
  • Abstract
    Microwave frequency standards based on buffer gas-cooled /sup 171/Yb/sup +/ ions have demonstrated high stability but are limited in accuracy by the second-order Doppler shift caused by thermal motion. We have previously obtained near shot noise-limited Ramsey fringes with a laser-cooled ion cloud. Here, we present measurements confirming that the ion temperature remains <1 K throughout the microwave interrogation period for a Ramsey pulse separation of up to 10 s and longer. The potential stability of the ions as a frequency standard is better than /spl sigma//sub y/ (/spl tau/)=5/spl times/10/sup -14/ /spl tau//sup -1/2/, and estimates of the systematic offsets to the clock frequency and their uncertainties indicate that a total uncertainty of four parts in 10/sup 15/ or better is achievable.
  • Keywords
    frequency stability; frequency standards; hyperfine structure; laser cooling; measurement uncertainty; microwave measurement; particle traps; ytterbium; /sup 171/Yb/sup +/; RF trap; Ramsey pulse separation; clock frequency systematic offsets; ground-state hyperfine transition; ion stability; ion temperature; laser-cooled /sup 171/Yb/sup +/ ions; laser-cooled ion cloud; linear Paul trap; microwave frequency standard; microwave interrogation period; near shot noise-limited Ramsey fringes; total uncertainty; Doppler shift; Frequency estimation; Gas lasers; Laser noise; Masers; Microwave frequencies; Pulse measurements; Temperature; Thermal stability; Uncertainty;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2002.1026029
  • Filename
    1026029