DocumentCode :
802918
Title :
Bayesian Gaussian Process Classification with the EM-EP Algorithm
Author :
Kim, Hyun-Chul ; Ghahramani, Zoubin
Author_Institution :
Dept. of Ind. & Manage. Eng.,, Pohang Univ. of Sci. & Technol.
Volume :
28
Issue :
12
fYear :
2006
Firstpage :
1948
Lastpage :
1959
Abstract :
Gaussian process classifiers (GPCs) are Bayesian probabilistic kernel classifiers. In GPCs, the probability of belonging to a certain class at an input location is monotonically related to the value of some latent function at that location. Starting from a Gaussian process prior over this latent function, data are used to infer both the posterior over the latent function and the values of hyperparameters to determine various aspects of the function. Recently, the expectation propagation (EP) approach has been proposed to infer the posterior over the latent function. Based on this work, we present an approximate EM algorithm, the EM-EP algorithm, to learn both the latent function and the hyperparameters. This algorithm is found to converge in practice and provides an efficient Bayesian framework for learning hyperparameters of the kernel. A multiclass extension of the EM-EP algorithm for GPCs is also derived. In the experimental results, the EM-EP algorithms are as good or better than other methods for GPCs or support vector machines (SVMs) with cross-validation
Keywords :
Bayes methods; Gaussian processes; expectation-maximisation algorithm; pattern classification; probability; support vector machines; Bayesian Gaussian process classification; Bayesian probabilistic kernel classifiers; EM algorithm; EM-EP algorithm; Gaussian process classifiers; expectation propagation approach; hyperparameters; latent function; support vector machines; Autocorrelation; Bayesian methods; Gaussian processes; Kernel; Machine learning; Machine learning algorithms; Monte Carlo methods; Multilayer perceptrons; Support vector machine classification; Support vector machines; Bayesian methods; EM-EP algorithm.; Gaussian process classification; expectation propagation; kernel methods; Algorithms; Artificial Intelligence; Bayes Theorem; Computer Simulation; Information Storage and Retrieval; Models, Statistical; Normal Distribution; Pattern Recognition, Automated;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.2006.238
Filename :
1717455
Link To Document :
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