DocumentCode
8030
Title
Modeling Terahertz Plasmonic Si FETs With SPICE
Author
Gutin, A. ; Nahar, Shamsun ; Hella, Mona ; Shur, M.
Author_Institution
Electr., Comput. & Syst. Eng. Dept., Rensselaer Polytech. Inst. (RPI), Troy, NY, USA
Volume
3
Issue
5
fYear
2013
fDate
Sept. 2013
Firstpage
545
Lastpage
549
Abstract
As operating frequencies of Si FETs continue to grow, commercial circuit modeling tools must provide accurate simulations at very high frequencies with the ability to model plasmonic FETs in large and complex circuits. Traditional compact SPICE models used by commercial CAD tools model the channel resistance and capacitance and gate resistance as single lumped elements or use approximations to model the distributed nature of the FET channel. At high frequencies, these models become inaccurate and fail to model device physics properly. To describe plasmonic FETs, a THz SPICE model is developed for Si FETs. The THz SPICE model is validated experimentally to be in close agreement with measured results. The model is used to show predicted device response at different technology nodes.
Keywords
SPICE; capacitance; electric resistance; elemental semiconductors; field effect transistors; plasmonics; semiconductor device models; silicon; terahertz wave devices; Si; THz SPICE model; capacitance; channel resistance; commercial CAD tools; commercial circuit modeling; complex circuits; device response; gate resistance; single lumped elements; terahertz plasmonic Si FET; CMOS terahertz (THz) detection; SPICE; THz modeling; patch antenna;
fLanguage
English
Journal_Title
Terahertz Science and Technology, IEEE Transactions on
Publisher
ieee
ISSN
2156-342X
Type
jour
DOI
10.1109/TTHZ.2013.2262799
Filename
6545392
Link To Document