DocumentCode :
8030
Title :
Modeling Terahertz Plasmonic Si FETs With SPICE
Author :
Gutin, A. ; Nahar, Shamsun ; Hella, Mona ; Shur, M.
Author_Institution :
Electr., Comput. & Syst. Eng. Dept., Rensselaer Polytech. Inst. (RPI), Troy, NY, USA
Volume :
3
Issue :
5
fYear :
2013
fDate :
Sept. 2013
Firstpage :
545
Lastpage :
549
Abstract :
As operating frequencies of Si FETs continue to grow, commercial circuit modeling tools must provide accurate simulations at very high frequencies with the ability to model plasmonic FETs in large and complex circuits. Traditional compact SPICE models used by commercial CAD tools model the channel resistance and capacitance and gate resistance as single lumped elements or use approximations to model the distributed nature of the FET channel. At high frequencies, these models become inaccurate and fail to model device physics properly. To describe plasmonic FETs, a THz SPICE model is developed for Si FETs. The THz SPICE model is validated experimentally to be in close agreement with measured results. The model is used to show predicted device response at different technology nodes.
Keywords :
SPICE; capacitance; electric resistance; elemental semiconductors; field effect transistors; plasmonics; semiconductor device models; silicon; terahertz wave devices; Si; THz SPICE model; capacitance; channel resistance; commercial CAD tools; commercial circuit modeling; complex circuits; device response; gate resistance; single lumped elements; terahertz plasmonic Si FET; CMOS terahertz (THz) detection; SPICE; THz modeling; patch antenna;
fLanguage :
English
Journal_Title :
Terahertz Science and Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
2156-342X
Type :
jour
DOI :
10.1109/TTHZ.2013.2262799
Filename :
6545392
Link To Document :
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