• DocumentCode
    803243
  • Title

    Accuracy of nonoscillating one-port noise measurements

  • Author

    Pantoja, Jose Miguel Miranda ; Grüb, Andreas ; Krozer, Viktor ; Franco, Jose Luis Sebastian

  • Author_Institution
    Dept. de Fisica Aplicada III, Univ. Complutense de Madrid, Spain
  • Volume
    44
  • Issue
    4
  • fYear
    1995
  • fDate
    8/1/1995 12:00:00 AM
  • Firstpage
    853
  • Lastpage
    859
  • Abstract
    This paper presents a detailed analysis of the accuracy of nonoscillating one-port device noise measurements. A new expression is given for the calculation of the noise temperature from parameters that can be measured directly by using either a power sensor or a noise meter with the capability of making power measurements. A general expression for the DUT noise temperature error function is also obtained, which enables the authors to study how the noise measurement accuracy is affected by a number of different factors. This expression has been found very useful in order to study how the accuracy can be improved in a given noise measurement system. The error function has been applied to evaluate the uncertainty of Schottky barrier device noise measurements
  • Keywords
    Schottky diode mixers; Schottky diodes; electric noise measurement; electric variables measurement; noise measurement; semiconductor device noise; semiconductor device testing; DUT noise temperature error function; Schottky barrier device; noise temperature; nonoscillating one-port noise measurement; power measurement; power sensor; Acoustical engineering; Calibration; Equations; Genetic expression; Integrated circuit measurements; Modems; Noise measurement; Power measurement; Schottky barriers; Temperature sensors;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.392870
  • Filename
    392870