DocumentCode :
803311
Title :
Modeling Lateral Parasitic Transistors in Smart Power ICs
Author :
Oehmen, Joerg ; Olbrich, Markus ; Hedrich, Lars ; Barke, Erich
Author_Institution :
Inst. of Microelectron. Syst., Hannover Univ.
Volume :
6
Issue :
3
fYear :
2006
Firstpage :
408
Lastpage :
420
Abstract :
Negative voltages in power stages of junction-isolated Smart Power ICs turn on parasitic bipolar transistors and inject minority carriers into the substrate, which can affect the functionality of the chip. In order to indicate inadmissible substrate currents and to evaluate protection measures, these parasitic transistors have to be included into a postlayout simulation. A methodology has been developed for automatically generating Verilog-A models for these parasites from layout data. These models account for an inhomogeneous current flow and high electron densities in the substrate. A reasonable tradeoff between convergence behavior and accuracy of the model has been found
Keywords :
bipolar transistors; electron density; power integrated circuits; semiconductor device models; Verilog-A models; high electron densities; lateral parasitic transistors; minority carriers; parasitic bipolar transistors; power system simulation; semiconductor device modeling; smart power integrated circuits; substrate currents; Bipolar transistors; Doping; Electrons; Power integrated circuits; Power system modeling; Protection; Radiative recombination; Spontaneous emission; Substrates; Voltage; Bipolar transistors; nonlinearities; numerical stability; power system simulation; semiconductor device modeling;
fLanguage :
English
Journal_Title :
Device and Materials Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
1530-4388
Type :
jour
DOI :
10.1109/TDMR.2006.881506
Filename :
1717490
Link To Document :
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