Title :
Measure of twist-induced circular birefringence in long single-mode fibers: theory and experiments
Author :
Galtarossa, Andrea ; Palmieri, Luca
Author_Institution :
DEI, Padova Univ., Italy
fDate :
7/1/2002 12:00:00 AM
Abstract :
Production defects and external perturbations cause standard telecommunication fibers to be randomly birefringent. Fiber birefringence is the origin of the well-known polarization mode dispersion (PMD), which degrades system performances. The knowledge of birefringence properties may be crucial, especially when problems like development of low-PMD fibers or PMD interaction with optical nonlinearities in very high-capacity systems are faced. Some techniques are known to measure birefringence, and useful results have been obtained for both installed and wound-on-drum fibers. However, measurement of the circular component of birefringence still presents difficulties. In this paper, a new method for circular birefringence measurement is proposed that applies to long single-mode twisted fibers. The technique is based on polarization-sensitive optical time-domain reflectometry. Experimental results are in good agreement with the theoretical analysis.
Keywords :
birefringence; optical fibre communication; optical fibre polarisation; optical fibre testing; optical time-domain reflectometry; PMD interaction; birefringence properties; circular birefringence measurement; external perturbations; fiber birefringence; fibre birefringence measurement; installed fibers; long single-mode fibers; long single-mode twisted fibers; low-PMD fibers; optical nonlinearities; polarization mode dispersion; polarization-sensitive optical time-domain reflectometry; production defects; randomly birefringent; standard telecommunication fibers; system performances; twist-induced circular birefringence measurement; wound-on-drum fibers; Birefringence; Fiber nonlinear optics; Nonlinear optics; Optical distortion; Optical fiber cables; Optical fiber polarization; Optical fiber testing; Optical fiber theory; Optical scattering; Reflectometry;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2002.800338