DocumentCode :
803351
Title :
Highly Reliable Nitride-Based LEDs With Internal ESD Protection Diodes
Author :
Chang, S.J. ; Shen, C.F. ; Shei, S.C. ; Chuang, R.W. ; Chang, C.S. ; Chen, W.S. ; Ko, T.K. ; Sheu, J.K.
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan
Volume :
6
Issue :
3
fYear :
2006
Firstpage :
442
Lastpage :
447
Abstract :
Nitride-based light-emitting diodes (LEDs) with internal electrostatic-discharge (ESD) protection diodes emitting at 460 nm were proposed and realized. By building an internal GaN p-n junction diode, a negative ESD-induced pulse current is expected to flow through the protection diode without damaging the major LED. The ESD characteristic of the fabricated LEDs was obviously improved with this design. Furthermore, the dimension of the internal p-n diode would influence the capacity for tolerating the ESD stress. It was found that a negative ESD threshold could be significantly increased from 300-400 to 2000 V. On the other hand, the authors managed to bring down the 20-mA operation voltage to 3.29 V using the n-metal finger, which entails a good current spreading under operation as the result of a reduced current-crowding effect. Since a good current spreading beneficially alleviates the thermal effect under long-term operation, an effective pattern layout design clearly would also prolong the lifetime of the proposed LEDs
Keywords :
electrostatic discharge; light emitting diodes; p-n junctions; semiconductor diodes; 20 mA; 2000 V; 3.29 V; 300 to 400 V; 460 nm; ESD protection diodes; ESD-induced pulse current; GaN; current spreading; current-crowding effect; electrostatic discharge; light emitting diodes; nitride-based LED; p-n junction diode; thermal effect; Buildings; Electrostatic discharge; Gallium nitride; III-V semiconductor materials; Light emitting diodes; Liquid crystal displays; P-n junctions; Packaging; Production; Protection; Current spreading; GaN; electrostatic-discharge (ESD); light-emitting diode (LED); protection diode;
fLanguage :
English
Journal_Title :
Device and Materials Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
1530-4388
Type :
jour
DOI :
10.1109/TDMR.2006.881454
Filename :
1717494
Link To Document :
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