DocumentCode :
803469
Title :
A new large-signal AlGaAs/GaAs HBT model including self-heating effects, with corresponding parameter-extraction procedure
Author :
Lu, Ke ; Perry, Philip A. ; Brazil, Thomas J.
Author_Institution :
Dept. of Electron. & Electr. Eng., Univ. Coll. Dublin, Ireland
Volume :
43
Issue :
7
fYear :
1995
fDate :
7/1/1995 12:00:00 AM
Firstpage :
1433
Lastpage :
1445
Abstract :
Accurate modelling of the microwave large-signal characteristics of AlGaAs/GaAs Heterojunction Bipolar Transistors (HBT´s) is extremely useful for microwave power applications of the device. This paper presents a new type of HBT large-signal model which is valid for dc, small-signal and large-signal ac modes of operation. The model may be used over a wide range of operating conditions and includes allowance for self-heating effects which are very important for HBT´s. Through the use of several novel features, the proposed approach is differentiated from the traditional Ebers-Moll or Gummel-Poon BJT representations. The new model is accompanied by a very simple parameter extraction process requiring only a series of conventional dc and multi-bias point small-signal S-parameter measurements. Finally, the model is validated by independent power sweep measurements on HBT´s from two different manufacturers
Keywords :
III-V semiconductors; S-parameters; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; microwave bipolar transistors; microwave power transistors; power bipolar transistors; semiconductor device models; AlGaAs-GaAs; AlGaAs/GaAs HBT model; S-parameters; heterojunction bipolar transistors; large-signal characteristics; microwave power applications; parameter extraction; self-heating; Bipolar transistors; Circuit synthesis; Electromagnetic heating; Gallium arsenide; Heterojunction bipolar transistors; Microwave devices; Parameter extraction; Power measurement; Power system modeling; Semiconductor diodes;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.392900
Filename :
392900
Link To Document :
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