DocumentCode :
803500
Title :
Feedback-induced noise in crossed field devices
Author :
Riyopoulos, Spilios A.
Author_Institution :
Science Applications Int. Corp., McLean, VA, USA
Volume :
20
Issue :
3
fYear :
1992
fDate :
6/1/1992 12:00:00 AM
Firstpage :
360
Lastpage :
369
Abstract :
A guiding center fluid model involving a single RF mode of slowly varying amplitude and phase is used to study the long-time behavior of a distributed emission, reentrant crossed-field amplifier. The space charge recirculation through the drift space provides the main coupling mechanism between the output and the input. The output fluctuations among successive tube passes in the RF power, phase shift and hub density generate a narrow bandwidth around the carrier. By fixing the external control parameters and varying the secondary emission coefficient or the recirculating hub charge fraction, the pass-to-pass fluctuations exhibit transitions from steady-state to periodic limit cycles and finally to unpredictable, chaotic behavior. It is shown that the development of chaotic output patterns is connected with slow, large-amplitude hub density oscillations during a single pass. Analysis shows that the nonlinear and time-delay effects characterizing the hub density evolution cause unstable, oscillatory behavior. The influence of excess space charge accumulation on the tube intrinsic noise is discussed
Keywords :
electron device noise; feedback; microwave tubes; space charge; RF power; chaotic behavior; chaotic output patterns; coupling mechanism; crossed field devices; distributed emission; drift space; excess space charge accumulation; external control parameters; feedback-induced noise; guiding center fluid model; large-amplitude hub density oscillations; narrow bandwidth; nonlinear effects; output fluctuations; pass-to-pass fluctuations; periodic limit cycles; phase shift; recirculating hub charge fraction; reentrant crossed-field amplifier; secondary emission coefficient; single RF mode; space charge recirculation; steady-state cycles; time-delay effects; tube intrinsic noise; Bandwidth; Chaos; Distributed amplifiers; Fluctuations; Limit-cycles; Power generation; Radio frequency; Radiofrequency amplifiers; Space charge; Steady-state;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/27.142837
Filename :
142837
Link To Document :
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