• DocumentCode
    803527
  • Title

    Simplified Microcircuit Modeling

  • Author

    Dickhaut, R.H.

  • Author_Institution
    Braddock, Dunn and McDonald, Inc. Albuquerque, New Mexico
  • Volume
    18
  • Issue
    6
  • fYear
    1971
  • Firstpage
    227
  • Lastpage
    236
  • Abstract
    The radiation effects modeling reported here reflects a black-box approach to the desired behavior, and does not necessarily bear a direct relationship to the physics of the real processes taking place within the microcircuit when stressed by radiation environments. The gamma dose rate and neutron fluence effects modeling are only representative of radiation effects modeling which could be incorporated into the basic model; and in no sense should they be interpreted as being exhaustive of the radiation effects which need to be modeled, or of the intrinsic capabilities of the model to be easily modified.
  • Keywords
    Central Processing Unit; Circuit analysis; Circuit simulation; Differential equations; Digital integrated circuits; Diodes; Integrated circuit modeling; Mathematical model; Transient analysis; Voltage;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1971.4326437
  • Filename
    4326437