DocumentCode
803527
Title
Simplified Microcircuit Modeling
Author
Dickhaut, R.H.
Author_Institution
Braddock, Dunn and McDonald, Inc. Albuquerque, New Mexico
Volume
18
Issue
6
fYear
1971
Firstpage
227
Lastpage
236
Abstract
The radiation effects modeling reported here reflects a black-box approach to the desired behavior, and does not necessarily bear a direct relationship to the physics of the real processes taking place within the microcircuit when stressed by radiation environments. The gamma dose rate and neutron fluence effects modeling are only representative of radiation effects modeling which could be incorporated into the basic model; and in no sense should they be interpreted as being exhaustive of the radiation effects which need to be modeled, or of the intrinsic capabilities of the model to be easily modified.
Keywords
Central Processing Unit; Circuit analysis; Circuit simulation; Differential equations; Digital integrated circuits; Diodes; Integrated circuit modeling; Mathematical model; Transient analysis; Voltage;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1971.4326437
Filename
4326437
Link To Document