DocumentCode :
803629
Title :
Highly reliable non-conductive adhesives for flip chip CSP applications
Author :
Yim, Myung-Jin ; Hwang, Jin-Sang ; Kwon, Woonseong ; Jang, Kyung Woon ; Paik, Kyung-Wook
Author_Institution :
Telephus Inc., Taejon, South Korea
Volume :
26
Issue :
2
fYear :
2003
fDate :
4/1/2003 12:00:00 AM
Firstpage :
150
Lastpage :
155
Abstract :
Non-conductive adhesives (NCA), widely used in display packaging and fine pitch flip chip packaging technology, have been recommended as one of the most suitable interconnection materials for flip-chip chip size packages (CSPs) due to the advantages such as easier processing, good electrical performance, lower cost, and low temperature processing. Flip chip assembly using modified NCA materials with material property optimization such as CTEs and modulus by loading optimized content of nonconductive fillers for the good electrical, mechanical and reliability characteristics, can enable wide application of NCA materials for fine pitch first level interconnection in the flip chip CSP applications. In this paper, we have developed film type NCA materials for flip chip assembly on organic substrates. NCAs are generally mixture of epoxy polymer resin without any fillers, and have high CTE values un-like conventional underfill materials used to enhance thermal cycling reliability of solder flip chip assembly on organic boards. In order to reduce thermal and mechanical stress and strain induced by CTE mismatch between a chip and organic substrate, the CTE of NCAs was optimized by filler content. The flip chip CSP assembly using modified NCA showed high reliability in various environmental tests, such as thermal cycling test (-55°C/+160°C, 1000 cycle), high temperature humidity test (85°C/85%RH, 1000 h) and high temperature storage test (125°C, dry condition). The material properties of NCA such as the curing profile, the thermal expansion, the storage modulus and adhesion were also investigated as a function of filler content.
Keywords :
adhesion; adhesives; chip scale packaging; curing; filled polymers; fine-pitch technology; flip-chip devices; integrated circuit interconnections; integrated circuit reliability; microassembling; thermal expansion; thermal stresses; -55 to 160 degC; 1000 h; Au; Au bump formation; CTE values; adhesion; curing profile; display packaging; electrical characteristics; environmental tests; epoxy polymer resin; filler content; film type nonconductive adhesive materials; fine pitch first level interconnection; fine pitch flip chip packaging; flip chip CSP applications; flip chip assembly; flip-chip chip size packages; high temperature humidity test; high temperature storage test; highly reliable nonconductive adhesives; interconnection materials; low temperature processing; material property optimization; mechanical characteristics; mechanical stress; nonconductive fillers; organic substrates; reliability characteristics; storage modulus; strain reduction; thermal cycling reliability; thermal expansion; thermal stress; Assembly; Flip chip; Material properties; Materials reliability; Nonconductive adhesives; Organic materials; Packaging; Substrates; Temperature; Testing;
fLanguage :
English
Journal_Title :
Electronics Packaging Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-334X
Type :
jour
DOI :
10.1109/TEPM.2003.817715
Filename :
1236880
Link To Document :
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