• DocumentCode
    803823
  • Title

    MSI Testing at Dose Rates from 109 to 1012 RAD (S1)/S

  • Author

    Alexander, D.R. ; Antinone, R.J.

  • Author_Institution
    Air Force Weapons Laboratory Kirtland AFB, New Mexico 87117
  • Volume
    18
  • Issue
    6
  • fYear
    1971
  • Firstpage
    439
  • Lastpage
    442
  • Abstract
    A group of seven different types of medium scale integrated circuits (MSI) were tested at dose rates from 109 to 1012 Rad (Si)/s. These included five types of bipolar circuits and two types of MOS circuits. Catastrophic failures were encountered in two types of bipolar circuits and one type of MOS circuit. Radiation response of all circuits is described in the following paper.
  • Keywords
    Circuit testing; Current supplies; Integrated circuit testing; Laboratories; Large scale integration; Power supplies; Shift registers; Signal to noise ratio; Voltage; Weapons;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1971.4326466
  • Filename
    4326466
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=803823