Title :
A Survey of Radiation Damage in Semiconductor Detectors
Author :
Goulding, Fred S. ; Pehl, Richard H.
Author_Institution :
Lawrence Berkeley Laboratory University of California Berkeley, California 94720
Abstract :
Examples of radiation damage in lithium-drifted detectors, lithium-drifted silicon detectors, and high-purity germanium detectors are discussed. The general patterns of damage, lithium-precipitation, annealing and recovery of detectors are outlined, and the observations are discussed.
Keywords :
Annealing; Educational institutions; Electron traps; Germanium; History; Laboratories; Radiation detectors; Semiconductor radiation detectors; Shape; Silicon radiation detectors;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1972.4326491
