DocumentCode :
804422
Title :
Oscillations in V(z) curves of thin samples
Author :
Mutti, Paolo ; Briggs, Andrew ; Bowler, Dave
Author_Institution :
Dipartimento di Ingegneria Nucl., Politecnico di Milano, Italy
Volume :
42
Issue :
4
fYear :
1995
fDate :
7/1/1995 12:00:00 AM
Firstpage :
567
Lastpage :
570
Abstract :
The explanation of the oscillations appearing at large defocus in the V(z) curves of thin specimens is given for isotropic and cubic materials. Using a ray model it is shown that oscillations are generated by the interference of the normal ray with the shear ray reflected from the bottom surface along a symmetrical path to the lens. The model predicts that in isotropic materials oscillations arise at critical values of defocus, while in anisotropic solids the onset of the oscillations depends on the shape of the slowness surface. In particular, for cubic crystals cut along.<>
Keywords :
III-V semiconductors; acoustic microscopy; gallium arsenide; GaAs; GaAs[001] wafers; anisotropic solid; cubic crystals; defocus; interference; isotropic materials; lens; normal ray; oscillations; ray model; reflection; shear ray; slowness surface; thin samples; Anisotropic magnetoresistance; Crystalline materials; Crystals; Interference; Lenses; Optical materials; Predictive models; Semiconductor device modeling; Shape; Solid modeling;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/58.393099
Filename :
393099
Link To Document :
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