Improved Infrared Response Measurements in Semiconductor Nuclear Radiation Detectors

An infrared response technique has been developed wnich has been shown to yield more detailed spectra than previous techniques and which can be used to identify more specifically energy levels arising from unwanted impurities and defects in semiconductor diodes used as nuclear radiation detectors. The presence of known impurities in germanium detectors, both lithium-compensated and high purity (uncompensated), has been confirmed using this technique. Such impurities include copper, gold, and iron. Features in the spectra associated with crystalline defects have also been identified.