Title :
The Magnetic Properties of Metallic Multilayers Prepared by UHV Evaporators
Author :
Irie, Y. ; Sakakima, H. ; Satomi, M.
Author_Institution :
Matsushita Electric Industrial Co., Ltd.
Abstract :
The MR (magnetoresistance) characteristics of metallic multilayer films are reported to be dependent on the method of preparation. Co/Cu multilayer films were prepared using a UHV evaporator. The MR characteristics were compared with those of sputtered films. Co/Cr multilayer films showed small-angle X-ray diffraction peaks and a large MR ratio of 15% at room temperature. However, NiFeCo/Cu multilayer films did not exhibit small-angle X-ray diffraction peaks, and their MR ratios were less than 2% at room temperature.
Keywords :
Chromium; Fabrication; Magnetic films; Magnetic multilayers; Magnetic properties; Nonhomogeneous media; Sputtering; Vacuum technology; Writing; X-ray diffraction;
Journal_Title :
Magnetics in Japan, IEEE Translation Journal on
DOI :
10.1109/TJMJ.1994.4565855
