DocumentCode :
804975
Title :
First electron availability and partial discharge generation in insulation cavities: effect of light irradiation
Author :
Cavallini, A. ; Ciani, F. ; Mazzanti, G. ; Montanari, G.C.
Author_Institution :
Bologna Univ., Italy
Volume :
12
Issue :
2
fYear :
2005
fDate :
4/1/2005 12:00:00 AM
Firstpage :
387
Lastpage :
394
Abstract :
An experimental investigation of the behavior of partial discharges occurring in insulation cavities as a function of light irradiation conditions is presented in this paper. Partial discharge inception voltage (PDIV) measurements were performed for different irradiation conditions of the test objects (visible light, of variable intensity, ultra violet (UV) light or absence of irradiation), defect geometry and conductivity of insulating material. It is shown that changes of such factors involve considerable alteration of partial discharge inception features, in terms of both inception voltage and delay time. Depending on applied field, defect geometry, insulating material characteristics and irradiation condition, in fact, partial discharge inception voltage may be influenced prevailingly by background radiation, as generally stated in literature, or by field-assisted electron detrapping from material-cavity interface.
Keywords :
electrons; insulating materials; partial discharge measurement; photoionisation; radiation effects; voltage measurement; UV; conductivity; defect geometry; delay time; dielectric radiation effects; electron availability; field-assisted electron detrapping; insulating material; insulation cavity; light irradiation; material-cavity interface; partial discharge generation; partial discharge inception voltage; photoionization; ultra violet light; variable intensity; visible light; Availability; Conducting materials; Conductivity measurement; Electrons; Geometry; Insulation; Partial discharge measurement; Partial discharges; Performance evaluation; Voltage measurement;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/TDEI.2005.1430406
Filename :
1430406
Link To Document :
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