• DocumentCode
    805120
  • Title

    Bandwidth Extension Techniques for CMOS Amplifiers

  • Author

    Shekhar, Sudip ; Walling, Jeffrey S. ; Allstot, David J.

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Washington, Seattle, WA
  • Volume
    41
  • Issue
    11
  • fYear
    2006
  • Firstpage
    2424
  • Lastpage
    2439
  • Abstract
    Inductive-peaking-based bandwidth extension techniques for CMOS amplifiers in wireless and wireline applications are presented. To overcome the conventional limits on bandwidth extension ratios, these techniques augment inductive peaking using capacitive splitting and magnetic coupling. It is shown that a critical design constraint for optimum bandwidth extension is the ratio of the drain capacitance of the driver transistor to the load capacitance. This, in turn, recommends the use of different techniques for different capacitance ratios. Prototype wideband amplifiers in 0.18-mum CMOS are presented that achieve a measured bandwidth extension ratio up to 4.1 and simultaneously maintain high gain (>12 dB) in a single stage. Even higher enhancement ratios are shown through the introduction of a modified series-peaking technique combined with staggering techniques. Ultra-wideband low-noise amplifiers in 0.18-mum CMOS are presented that exhibit bandwidth extension ratios up to 4.9
  • Keywords
    CMOS integrated circuits; low noise amplifiers; radio receivers; ultra wideband communication; 0.18 micron; CMOS amplifiers; CMOS integrated circuit; T-coil; bandwidth extension; capacitive splitting; drain capacitance; driver transistor; inductive-peaking; magnetic coupling; ultra-wideband low-noise amplifiers; wireless applications; wireline applications; Bandwidth; Broadband amplifiers; CMOS technology; Capacitance; Couplings; Driver circuits; Gain measurement; Low-noise amplifiers; Prototypes; Ultra wideband technology; Bandwidth extension; T-coil; low-noise amplifier; low-power; peaking; staggering; transformer; ultra-wideband (UWB); wireless; wireline;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2006.883336
  • Filename
    1717666