Title :
Digitally generated CPFSK IF test signals including phase noise
Author :
van Bennekom, P. ; van der Put, E. ; van Etten, W. ; van den Boom, Henrie
Author_Institution :
Fac. of Electr. Eng., Eindhoven Univ. of Technol., Netherlands
fDate :
7/1/1995 12:00:00 AM
Abstract :
We present a simple, all electrical method for the generation of test signals for testing of fiber-optic coherent CPFSK IF receiver systems, using a programmable bit error rate tester. The feature to be able to add phase noise to the IF signal makes it possible to evaluate receiver system behavior with relation to local oscillator phase noise.<>
Keywords :
frequency shift keying; optical fibre testing; optical modulation; optical noise; optical receivers; oscillators; phase noise; all electrical method; digitally generated CPFSK IF test signals; fiber-optic coherent CPFSK IF receiver systems; local oscillator phase noise; phase noise; programmable bit error rate tester; receiver system behavior; test signal generation; Bit error rate; Bit rate; Clocks; Frequency synthesizers; Modulation; Optical receivers; Phase noise; Signal generators; Signal synthesis; System testing;
Journal_Title :
Photonics Technology Letters, IEEE
