DocumentCode :
805150
Title :
Coherent optical frequency domain reflectometry for a long single-mode optical fiber using a coherent lightwave source and an external phase modulator
Author :
Tsuji, K. ; Shimizu, K. ; Horiguchi, T. ; Koyamada, Y.
Author_Institution :
NTT Access Network Syst. Labs., Ibaraki, Japan
Volume :
7
Issue :
7
fYear :
1995
fDate :
7/1/1995 12:00:00 AM
Firstpage :
804
Lastpage :
806
Abstract :
Coherent optical frequency domain reflectometry (C-OFDR) is demonstrated for a long single-mode optical fiber at a wavelength of 1.55 μm by using a highly coherent lightwave source and an electrooptical (EO) external phase modulator. Rayleigh backscattering and Fresnel reflection from a 16.4-km optical fiber are observed when the modulation frequency is swept from 4 GHz to 8 GHz for 40 ms. The insertion of an optical fiber delay line in a probe lightwave path makes it possible to distinguish the Rayleigh backscattering profile due to the first-order modulation sideband in the phase-modulated lightwave from those due to the higher order sidebands. A spatial resolution of better than 100 m is achieved for two neighboring Fresnel reflectors located near the far end of the test fiber.
Keywords :
Rayleigh scattering; backscatter; electro-optical modulation; light coherence; light scattering; optical fibre testing; optical time-domain reflectometry; phase modulation; 1.55 mum; 16.4 km; 4 to 8 GHz; 40 ms; Fresnel reflection; Rayleigh backscattering; Rayleigh backscattering profile; coherent lightwave source; coherent optical frequency domain reflectometry; electrooptical external phase modulator; external phase modulator; far end; first-order modulation sideband; higher order sidebands; highly coherent lightwave source; long single-mode optical fiber; modulation frequency; neighboring Fresnel reflectors; optical fiber delay line insertion; phase-modulated lightwave; probe lightwave path; spatial resolution; test fiber; Backscatter; Delay lines; Electrooptic modulators; Frequency domain analysis; Frequency modulation; Fresnel reflection; Optical fibers; Optical modulation; Phase modulation; Reflectometry;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/68.393212
Filename :
393212
Link To Document :
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