• DocumentCode
    805214
  • Title

    Ultrashort pulsed electric fields induce membrane phospholipid translocation and caspase activation: differential sensitivities of Jurkat T lymphoblasts and rat glioma C6 cells

  • Author

    Vernier, P. Thomas ; Li, Aimin ; Marcu, Laura ; Craft, Cheryl M. ; Gundersen, Martin A.

  • Author_Institution
    Dept. of Electr. Eng.- Electrophys., Univ. of Southern California, Los Angeles, CA, USA
  • Volume
    10
  • Issue
    5
  • fYear
    2003
  • Firstpage
    795
  • Lastpage
    809
  • Abstract
    Megavolt-per-meter electric pulses with durations shorter than charging time constants associated with external cell membrane dielectric properties can generate significant voltages on the membranes of intracellular structures. Nanosecond-duration, high-field (2-4 MV/m) pulses are not immediately lethal to cells and do not produce the conductive openings in the cytoplasmic membrane associated with long-pulse, low-field electroporation, but can induce profound physiological changes, including apoptosis (programmed cell death). We demonstrate rapid, non-destructive, field-dependent translocation of the plasma membrane inner leaflet phospholipid phosphatidylserine in Jurkat T lymphocytes, and we show that cells which exhibit a similar geometry in suspension, rat glioma C6 cells, are highly resistant to these pulses and respond differently even to much higher doses.
  • Keywords
    bioelectric phenomena; biological effects of fields; biomembrane transport; blood; cancer; cellular effects of radiation; electric field effects; organic compounds; Jurkat T lymphoblasts; apoptosis; cell suspension; conductive openings; cytoplasmic membrane; electroperturbation; electroporation; membrane inner leaflet phospholipid phosphatidylserine; phosphatidylserine translocation; profound physiological changes; programmed cell death; rat glioma C6 cells; ultrashort electric pulse; Biological system modeling; Biomedical engineering; Biomembranes; Cells (biology); Dielectrics; Geometry; Laboratories; Plasmas; Solid modeling; Voltage;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2003.1237329
  • Filename
    1237329