• DocumentCode
    805596
  • Title

    The Electron Beam Ion Source and Some Possibilities for Improvement

  • Author

    Becker, R. ; Klein, H. ; Schmidt, W.

  • Author_Institution
    Staff Member of the Gesellschaft fÿr Schwerionenforschung Darmstadt
  • Volume
    19
  • Issue
    2
  • fYear
    1972
  • fDate
    4/1/1972 12:00:00 AM
  • Firstpage
    125
  • Lastpage
    131
  • Abstract
    Considering basic properties of the EBIS, as vacuum requirements, ion yield, and emittance, it is pointed out, that the EBIS - as proposed by Donets - is restricted in priciple to a poor yield of highly charged ions, To overcome this, a concept for a "dynamic containment" is presented. This means, that the axial ion movement between first ionization and the extraction is delayed in order to give the necessary containment time at CW-operation. Realization seems to be possible by the partly permeable mirrors, produced by the axial alternating magnetic field of opposing permanent ring magnets, which also provide for electron focusing, considerable reduction of vacuum requirements, and saving of power consumption.
  • Keywords
    Delay effects; Electron beams; Electron traps; Elementary particle vacuum; Ion sources; Ionization; Magnetic fields; Magnets; Mirrors; Production;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1972.4326643
  • Filename
    4326643