DocumentCode :
805596
Title :
The Electron Beam Ion Source and Some Possibilities for Improvement
Author :
Becker, R. ; Klein, H. ; Schmidt, W.
Author_Institution :
Staff Member of the Gesellschaft fÿr Schwerionenforschung Darmstadt
Volume :
19
Issue :
2
fYear :
1972
fDate :
4/1/1972 12:00:00 AM
Firstpage :
125
Lastpage :
131
Abstract :
Considering basic properties of the EBIS, as vacuum requirements, ion yield, and emittance, it is pointed out, that the EBIS - as proposed by Donets - is restricted in priciple to a poor yield of highly charged ions, To overcome this, a concept for a "dynamic containment" is presented. This means, that the axial ion movement between first ionization and the extraction is delayed in order to give the necessary containment time at CW-operation. Realization seems to be possible by the partly permeable mirrors, produced by the axial alternating magnetic field of opposing permanent ring magnets, which also provide for electron focusing, considerable reduction of vacuum requirements, and saving of power consumption.
Keywords :
Delay effects; Electron beams; Electron traps; Elementary particle vacuum; Ion sources; Ionization; Magnetic fields; Magnets; Mirrors; Production;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1972.4326643
Filename :
4326643
Link To Document :
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