DocumentCode :
805791
Title :
A Technique for Measuring Thin-Film Inductors Driven at High Flux Densities
Author :
Yamaguchi, M. ; Okuyama, H. ; Arai, K.I.
Author_Institution :
Tohoku University.
Volume :
9
Issue :
6
fYear :
1994
Firstpage :
66
Lastpage :
71
Abstract :
This paper discusses the basic properties of thin-film inductors driven at high flux densities. We made inner-coil-type thin-film inductors, each with either a closed or an open magnetic circuit, and developed a technique for measuring the impedance of the inductors at high flux densities. We used this technique to reduce the multiple voltage reflections between amplifier and inductor. The impedance of the magnetic thin-film inductors varied according to the magnetic field intensity, because of flux saturation.
Keywords :
Attenuation measurement; Attenuators; Broadband amplifiers; Density measurement; Impedance measurement; Magnetic films; Power measurement; Reflection; Thin film devices; Thin film inductors;
fLanguage :
English
Journal_Title :
Magnetics in Japan, IEEE Translation Journal on
Publisher :
ieee
ISSN :
0882-4959
Type :
jour
DOI :
10.1109/TJMJ.1994.4565959
Filename :
4565959
Link To Document :
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