• DocumentCode
    806251
  • Title

    Comments on "W-Band Multiport Substrate-Integrated Waveguide Circuits

  • Author

    Ellis, Timothy J.

  • Volume
    54
  • Issue
    11
  • fYear
    2006
  • Firstpage
    4016
  • Lastpage
    4016
  • Abstract
    The paper by Moldovan presents simulated and measured data on "new" circuit structures based on the substrate-integrated waveguide transmission line. The sometimes significant difference between measured and simulated data is broadly attributed to "fabrication error," and in some cases, the measured data does not account for all of the signal energy. It is also unclear as to what aspects of the presented work are different from previously reported structures by the authors
  • Keywords
    integrated optoelectronics; submillimetre wave propagation; waveguide junctions; W-band multiport substrate; circuit structures; fabrication error; integrated waveguide circuits; measurement error; substrate-integrated waveguide transmission line; Antenna measurements; Band pass filters; Circuit simulation; Couplers; Energy measurement; Frequency; Insertion loss; Measurement errors; Nonlinear filters; Transmission line measurements; Fabrication error; measurement error; substrate-integrated waveguide (SIW);
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2006.884623
  • Filename
    1717773