Title :
Comments on "W-Band Multiport Substrate-Integrated Waveguide Circuits
Author :
Ellis, Timothy J.
Abstract :
The paper by Moldovan presents simulated and measured data on "new" circuit structures based on the substrate-integrated waveguide transmission line. The sometimes significant difference between measured and simulated data is broadly attributed to "fabrication error," and in some cases, the measured data does not account for all of the signal energy. It is also unclear as to what aspects of the presented work are different from previously reported structures by the authors
Keywords :
integrated optoelectronics; submillimetre wave propagation; waveguide junctions; W-band multiport substrate; circuit structures; fabrication error; integrated waveguide circuits; measurement error; substrate-integrated waveguide transmission line; Antenna measurements; Band pass filters; Circuit simulation; Couplers; Energy measurement; Frequency; Insertion loss; Measurement errors; Nonlinear filters; Transmission line measurements; Fabrication error; measurement error; substrate-integrated waveguide (SIW);
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2006.884623
