A theory of electrical circuits with resistively coupled distributed structures: delay time predicting

Author

Marinov, Corneliu A. ; Neittaanmäki, Pekka

Author_Institution

Fac. of Electrotech., Polytech. Inst. of Bucharest, Romania

Volume

35

Issue

2

fYear

1988

fDate

2/1/1988 12:00:00 AM

Firstpage

173

Lastpage

183

Abstract

Qualitative properties (existence, uniqueness, and especially, stability) and numerical solution of a circuit consisting of a resistive multiport with r-c-g exactly modeled distributed elements connected to its terminals, are studied. These results are useful, for instance, when the effects of interconnections on the speed of the transient process in an integrated structure are studied. A formula to evaluate the delay time as a global parameter of the circuit is given and verified by numerical calculus

Keywords

delays; multiport networks; network analysis; network parameters; stability; delay time predicting; electrical circuits; global parameter; integrated structure; interconnections; resistive multiport; resistively coupled distributed structures; stability; transient process; Circuit stability; Coupling circuits; Delay effects; Equations; Integrated circuit interconnections; Integrated circuit technology; Mathematical model; Predictive models; Stability criteria; Thin film circuits;

fLanguage

English

Journal_Title

Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0098-4094

Type

jour

DOI

10.1109/31.1719

Filename

1719