Author_Institution :
IMB Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
Recent major progress in the area of advanced DRAM cell structures is described, focusing on three-dimensional approaches. Cell design criteria are first outlined. Then a number of structures are discussed, namely, the stacked-capacitor cell, the trench-capacitor cell, the substrate-plate trench-capacitor cell, the dielectrically insulated trench cell, the buried stacked-capacitor cell, the folded-capacitor cell, the isolation-merged vertical-capacitor cell, the buried-capacitor or stacked transistor cell, and the trench transistor cell. Future trends in cell structures are projected.<>
Keywords :
cellular arrays; integrated memory circuits; random-access storage; advanced DRAM cell structures; buried stacked-capacitor cell; buried-capacitor; cell design; dielectrically insulated trench cell; folded-capacitor cell; isolation-merged vertical-capacitor cell; stacked transistor cell; stacked-capacitor cell; substrate-plate trench-capacitor cell; three-dimensional approaches; trench transistor cell; trench-capacitor cell; Capacitance; Capacitors; Costs; Dielectrics and electrical insulation; Electronics industry; Productivity; Random access memory; Read-write memory; Semiconductor memory; Voltage;