Title :
Converter-Gating: A Power Efficient and Secure On-Chip Power Delivery System
Author :
Uzun, Orhun Aras ; Kose, Selcuk
Author_Institution :
Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA
Abstract :
Dynamic power management techniques and related voltage converter architectures are proposed to design a secure and efficient on-chip power delivery system. A new power management technique, converter-gating, that adaptively turns on and off individual stages of an interleaved switched-capacitor voltage converter based on the workload information to improve the voltage conversion efficiency is proposed. Converter-gating technique is further utilized as a countermeasure against side channel power analysis attacks by pseudo-randomly controlling the converter activity. A new method is proposed to improve the response time of the converter during transient load changes by adaptively configuring the conversion ratio of a switched capacitor voltage converter. The proposed converter is designed and verified using IBM 130 nm technology kit. The proposed system achieves 5% higher power conversion efficiency compared to conventional converters, improves the response time to transient load changes from 1.4 μs to 104 ns and reduces the correlation between the input current and load current.
Keywords :
cryptography; power convertors; switched capacitor networks; voltage control; IBM 130 nm technology kit; conversion ratio; converter-gating; dynamic power management techniques; interleaved switched-capacitor voltage converter; on-chip power delivery system; response time; side channel power analysis attacks; time 1.4 mus to 104 ns; transient load changes; voltage conversion efficiency; voltage converter architectures; workload information; Capacitors; Power conversion; Power demand; Regulators; Switches; System-on-chip; Voltage control; DC-DC converter; hardware security; on-chip voltage regulation; side-channel attack; switched capacitor;
Journal_Title :
Emerging and Selected Topics in Circuits and Systems, IEEE Journal on
DOI :
10.1109/JETCAS.2014.2315880