DocumentCode :
806738
Title :
Optimal granularity and scheme of parallel test generation in a distributed system
Author :
Fujiwara, Hideo ; Inoue, Tomoo
Author_Institution :
Graduate Sch. of Inf. Sci., Nara Inst. of Sci. & Technol., Japan
Volume :
6
Issue :
7
fYear :
1995
fDate :
7/1/1995 12:00:00 AM
Firstpage :
677
Lastpage :
686
Abstract :
Client-Agent-Server model (CAS model) which can decrease the work load of the client by adding agent processors to the Client-Server model (CS model) is proposed and an approach to parallel test generation for logic circuits on the CAS model is presented. Two problems are considered: optimal granularity problem and optimal scheme problem. First, the problem of parallel test generation on the CAS model is formulated to analyze the effect of the granularity (grain size of target faults allocated to processors) in both cases of static and dynamic task allocation (optimal granularity problem). Then the relationship between the number of processors and the total processing time is analyzed (optimal scheme problem). From the analysis, it is shown that the CAS model can reduce the total processing time over the CS model and that there exists an optimal scheme (an optimal pair of numbers of agent processors and server processors) for the CAS model which minimizes the total processing time for a given number of processors. To corroborate the analysis, the proposed parallel test generation algorithm is implemented on a network of more than 100 workstations and experimental results for the ISCAS benchmark circuits are presented. It is shown that the experimental results are very close to the theoretical results which confirms the existence of optimal granularity and optimal scheme which minimizes the total processing time for the CAS model
Keywords :
client-server systems; combinational circuits; logic testing; parallel processing; ISCAS benchmark circuits; client-agent-server model; client-server model; distributed system; grain size; logic circuits; optimal granularity; optimal granularity problem; optimal scheme; parallel test generation; parallel test generation algorithm; target faults; Algorithm design and analysis; Benchmark testing; Circuit faults; Circuit testing; Content addressable storage; Grain size; Logic circuits; Logic testing; Network servers; Workstations;
fLanguage :
English
Journal_Title :
Parallel and Distributed Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1045-9219
Type :
jour
DOI :
10.1109/71.395397
Filename :
395397
Link To Document :
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