DocumentCode
806825
Title
Intimate monolithic integration of chip-scale photonic circuits
Author
Sabnis, Vijit A. ; Demir, Hilmi Volkan ; Fidaner, Onur ; Zheng, Jun-Fei ; Harris, James S., Jr. ; Miller, David A B ; Li, Nelson ; Wu, Ta-Chung ; Chen, H.-T. ; Houng, Yu-Min
Author_Institution
Dept. of Electr. Eng., Stanford Univ., CA, USA
Volume
11
Issue
6
fYear
2005
Firstpage
1255
Lastpage
1265
Abstract
In this paper, we introduce a robust monolithic integration technique for fabricating photonic integrated circuits comprising optoelectronic devices (e.g., surface-illuminated photodetectors, waveguide quantum-well modulators, etc.) that are made of completely separate epitaxial structures and possibly reside at different locations across the wafer as necessary. Our technique is based on the combination of multiple crystal growth steps, judicious placement of epitaxial etch-stop layers, a carefully designed etch sequence, and self-planarization and passivation steps to compactly integrate optoelectronic devices. This multigrowth integration technique is broadly applicable to most III-V materials and can be exploited to fabricate sophisticated, highly integrated, multifunctional photonic integrated circuits on a single substrate. As a successful demonstration of this technique, we describe integrated photonic switches that consume only a 300 ×300 μm footprint and incorporate InGaAs photodetector mesas and InGaAsP/InP quantum-well modulator waveguides separated by 50 μm on an InP substrate. These switches perform electrically-reconfigurable optically-controlled wavelength conversion at multi-Gb/s data rates over the entire center telecommunication wavelength band.
Keywords
III-V semiconductors; epitaxial growth; etching; gallium arsenide; gallium compounds; indium compounds; integrated optics; integrated optoelectronics; monolithic integrated circuits; optical fibre communication; optical modulation; optical switches; optical waveguides; optical wavelength conversion; passivation; photodetectors; planarisation; quantum well devices; semiconductor epitaxial layers; 300 mum; 50 mum; III-V materials; InGaAs; InGaAs photodetector mesas; InGaAsP-InP; InP; InP substrate; chip-scale photonic circuits; epitaxial etch-stop layers; epitaxial structures; etch sequence; integrated photonic switches; monolithic integration; multigrowth integration; multiple crystal growth; optoelectronic devices; passivation; photonic integrated circuits; self-planarization; surface-illuminated photodetectors; waveguide quantum-well modulators; wavelength conversion; Etching; III-V semiconductor materials; Monolithic integrated circuits; Optical modulation; Optical switches; Optical waveguides; Optoelectronic devices; Photodetectors; Photonic integrated circuits; Substrates; Integrated optoelectronic devices; monolithic integration; photonic switches; selective area growth (SAG);
fLanguage
English
Journal_Title
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
1077-260X
Type
jour
DOI
10.1109/JSTQE.2005.860995
Filename
1583641
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