• DocumentCode
    806852
  • Title

    Nonselective Wet Oxidation of AlGaAs Heterostructure Waveguides Through Controlled Addition of Oxygen

  • Author

    Luo, Yong ; Hall, Douglas C.

  • Volume
    11
  • Issue
    6
  • fYear
    2005
  • Firstpage
    1284
  • Lastpage
    1291
  • Abstract
    We present data showing that the addition of trace amounts of O _2 ( \\ll 1\\hbox {%} relative to N _2 ) to N _2+ H _2 O process gas during the wet thermal oxidation of Al _ x Ga _1 -x As enhances the oxidation rates of lower Al content ( x\\le 0.8) alloys (a tenfold increase for  x=0.3 ), while decreasing the oxidation rate selectivity  R( x=0.8)/ R( x=0.3) by a factor of seven. An increase in the refractive index from 1.49 to 1.68, and a fourfold decrease in surface roughness, indicates the formation of a denser, higher quality oxide for  x=0.3 AlGaAs. Oxides are characterized by prism coupling, atomic force microscopy, and scanning electron microscopy. Thermochemical calculations show a probable mechanism in the enhancement of the dry oxidation reactions of AlGaAs for low levels of O _2 , while there is still an adequate quantity of H _2 produced to reduce As oxides in the wet oxidation process. An AlGaAs quantum well heterostructure p-n laser diode crystal is nonselectively oxidized to create a deep oxide, high-index contrast waveguide with potential applications in semiconductor photonic integrated circuits that require small bend radius, high isolation, low crosstalk optical waveguides.
  • Keywords
    Integrated optoelectronics; materials processing; semiconductor films; semiconductor waveguides; Aluminum alloys; Atomic force microscopy; Gallium alloys; Optical waveguides; Oxidation; Oxygen; Refractive index; Scanning electron microscopy; Semiconductor waveguides; Thermal factors; Integrated optoelectronics; materials processing; semiconductor films; semiconductor waveguides;
  • fLanguage
    English
  • Journal_Title
    Selected Topics in Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    1077-260X
  • Type

    jour

  • DOI
    10.1109/JSTQE.2005.859024
  • Filename
    1583644