Title :
Numerical analysis of InP/InGaAsP ARROW waveguides using transfer matrix approach
Author :
Kubica, Jacek M.
Author_Institution :
Inst. of Phys., Warsaw Univ. of Technol., Poland
fDate :
6/1/1992 12:00:00 AM
Abstract :
The transfer matrix method is employed to analyze the modal propagation within planar InP/InGaAsP antiresonant reflecting optical waveguides (ARROW) at the operational wavelength of 1.55 μm. The numerical results provide an accurate picture of dispersion and attenuation of both TE and TM polarized waves. Spatial properties of the modes are also investigated and detailed plots of the variation of electric field amplitude with layer thickness are given
Keywords :
III-V semiconductors; gallium arsenide; gallium compounds; indium compounds; integrated optics; optical waveguide theory; 1.55 micron; ARROW waveguides; IR; InP-InGaAsP; TE polarised waves; TM polarized waves; antiresonant reflecting optical waveguides; attenuation; dispersion; electric field amplitude; layer thickness; modal propagation; numerical analysis; operational wavelength; semiconductors; transfer matrix approach; Indium phosphide; Numerical analysis; Optical attenuators; Optical planar waveguides; Optical polarization; Optical propagation; Optical waveguides; Planar waveguides; Tellurium; Transmission line matrix methods;
Journal_Title :
Lightwave Technology, Journal of
