Numerical analysis of InP/InGaAsP ARROW waveguides using transfer matrix approach

Author

Kubica, Jacek M.

Author_Institution

Inst. of Phys., Warsaw Univ. of Technol., Poland

Volume

10

Issue

6

fYear

1992

fDate

6/1/1992 12:00:00 AM

Firstpage

767

Lastpage

771

Abstract

The transfer matrix method is employed to analyze the modal propagation within planar InP/InGaAsP antiresonant reflecting optical waveguides (ARROW) at the operational wavelength of 1.55 μm. The numerical results provide an accurate picture of dispersion and attenuation of both TE and TM polarized waves. Spatial properties of the modes are also investigated and detailed plots of the variation of electric field amplitude with layer thickness are given

Keywords

III-V semiconductors; gallium arsenide; gallium compounds; indium compounds; integrated optics; optical waveguide theory; 1.55 micron; ARROW waveguides; IR; InP-InGaAsP; TE polarised waves; TM polarized waves; antiresonant reflecting optical waveguides; attenuation; dispersion; electric field amplitude; layer thickness; modal propagation; numerical analysis; operational wavelength; semiconductors; transfer matrix approach; Indium phosphide; Numerical analysis; Optical attenuators; Optical planar waveguides; Optical polarization; Optical propagation; Optical waveguides; Planar waveguides; Tellurium; Transmission line matrix methods;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/50.143076

Filename

143076