Abstract :
There has been an increasing need for technologies to better monitor the condition of their complex products and systems from the design stage, through manufacturing, to their applications. Better condition monitoring enables better quality control, which is essential for economical, environmental, availability, and safety reasons. One way to achieve such a goal is using built-in-test (BIT), which incorporates test and diagnostic functionality into a component´s structure at the design stage. A system with BIT is characterized by the ability to identify operational conditions by itself, through the built-in diagnostic capabilities. Such a design philosophy has been widely applied to the design and testing of complex, mixed-signal electronic systems, such as ICs and multifunction instrumentation. Various techniques have been developed over the past three decades to implement BIT in industry, especially in semiconductors, manufacturing processes, aerospace, and transportation (Bardell and Mcanney, 1988; Baker et al., 1990; Cox et al., 1999). This article looks at BIT implementation in the IC industry, manufacturing, and the automobile industry, along with the future prospects of this technique
Keywords :
automatic testing; automotive electronics; built-in self test; condition monitoring; integrated circuit testing; process monitoring; quality control; technological forecasting; BIT; IC industry; aerospace; automobile industry; built-in-test; condition monitoring; design stage; diagnostic functionality; integrated circuits; manufacturing industry; manufacturing processes; mixed-signal electronic systems; multifunction instrumentation; operational conditions; quality control; safety; system diagnosis; test functionality; transportation; Aerospace industry; Aerospace testing; Built-in self-test; Condition monitoring; Electronic equipment testing; Environmental economics; Manufacturing industries; Quality control; Safety; System testing;
