Title :
Analog Modulation of 650-nm VCSELs
Author :
Ballmann, T. ; Rossbach, R. ; Butendeich, R. ; Raabe, B. ; Jetter, M. ; Scholz, F. ; Schweizer, H.
Author_Institution :
Phys. Inst., Univ. of Stuttgart
Abstract :
Small-signal properties of 650-nm vertical-cavity surface-emitting lasers (VCSELs) with different oxide aperture sizes were measured. A small diameter VCSEL of 3.5 mum has a maximum resonance frequency of 5.7 GHz. The photon density determines the maximum resonance frequency. Modeling also indicates higher photon densities in the small VCSEL due to better thermal behavior
Keywords :
optical communication equipment; optical modulation; quantum well lasers; semiconductor device measurement; semiconductor device models; surface emitting lasers; 3.5 mum; 5.7 GHz; 650 nm; VCSEL; photon density; resonance frequency; thermal behavior; vertical-cavity surface-emitting lasers; Apertures; Fiber lasers; Laser modes; Optical modulation; Optical scattering; Optical surface waves; Resonance; Resonant frequency; Surface emitting lasers; Vertical cavity surface emitting lasers; 650-nm vertical-cavity surface-emitting laser (VCSEL); modulation; optical scattering; thermal limit; vertical-cavity surface-emitting lasers (VCSELs);
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2005.863997
