• DocumentCode
    807304
  • Title

    Terminal Modeling and Photocompensation of Complex Microcircuits

  • Author

    Pocock, D.N. ; Krebs, M.G.

  • Author_Institution
    Northrop Corporate Laboratories Hawthorne, California 90250
  • Volume
    19
  • Issue
    6
  • fYear
    1972
  • Firstpage
    86
  • Lastpage
    93
  • Abstract
    Results are presented on generalized approaches to derive radiation-inclusive simplified models of linear and digital microcircuits. Application of the principle of superposition allows generation of a compact small-signal model of the linear microcircuit, with extension of the model to include large-signal saturation effects. The digital microcircuit model is the combination of current-voltage terminal networks with a logical decision function to represent the truth table of the device. A factor of 20 to 50 improvement in required computer time and storage was realized with the terminal models over detailed models, with no significant loss in the representation of key performance parameters or radiation vulnerability. The linear modeling technique suggests that photocompensation networks can be applied successfully at the terminals of the device.
  • Keywords
    Admittance; Circuit analysis computing; Computer aided analysis; Equations; Ionizing radiation; Laboratories; Large scale integration; Performance loss; Photoconductivity; Voltage;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1972.4326813
  • Filename
    4326813