Title :
Modeling IC´s in an Ionizing Radiation Environment with a Time Varying Wiener Model
Author :
Chao, K.S. ; Liberty, S.R. ; Seacat, R.H. ; Chipman, M.A.
Author_Institution :
Department of Electrical Engineering Texas Tech University Lubbock, Texas 79409
Abstract :
The Wiener theory of modeling nonlinear systems is generalized to include time varying systems. With radiation effects in integrated circuits being considered as internal time varying effects, this generalized technique can be used to model an integrated circuit in a radiation environment.
Keywords :
Chaos; Charge carriers; Integrated circuit modeling; Ionizing radiation; Nonlinear systems; Photoconductivity; Polynomials; Radiation effects; Semiconductor devices; Time varying systems;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1972.4326814
