DocumentCode :
807413
Title :
Analysis of incorporating logistic testing-effort function into software reliability modeling
Author :
Huang, Chin-Yu ; Kuo, Sy-Yen
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Volume :
51
Issue :
3
fYear :
2002
fDate :
9/1/2002 12:00:00 AM
Firstpage :
261
Lastpage :
270
Abstract :
This paper investigates a SRGM (software reliability growth model) based on the NHPP (nonhomogeneous Poisson process) which incorporates a logistic testing-effort function. SRGM proposed in the literature consider the amount of testing-effort spent on software testing which can be depicted as an exponential curve, a Rayleigh curve, or a Weibull curve. However, it might not be appropriate to represent the consumption curve for testing-effort by one of those curves in some software development environments. Therefore, this paper shows that a logistic testing-effort function can be expressed as a software-development/test-effort curve and that it gives a good predictive capability based on real failure-data. Parameters are estimated, and experiments performed on actual test/debug data sets. Results from applications to a real data set are analyzed and compared with other existing models to show that the proposed model predicts better. In addition, an optimal software release policy for this model, based on cost-reliability criteria, is proposed
Keywords :
parameter estimation; program testing; software reliability; stochastic processes; Rayleigh curve; Weibull curve; consumption curve; cost-reliability criteria; exponential curve; failure-data; logistic testing-effort function; mean value function; nonhomogeneous Poisson process; optimal software release policy; parameters estimation; predictive capability; software reliability growth model; software reliability modeling; software testing; software-development/test-effort curve; test/debug data sets; Cost function; Least squares approximation; Life testing; Logistics; Maximum likelihood estimation; Parameter estimation; Predictive models; Programming; Software reliability; Software testing;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.2002.801847
Filename :
1028398
Link To Document :
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