Title :
High external feedback resistance of laterally loss-coupled distributed feedback quantum dot semiconductor lasers
Author :
Su, H. ; Zhang, L. ; Gray, A.L. ; Wang, R. ; Newell, T.C. ; Malloy, K.J. ; Lester, L.F.
Author_Institution :
Center of High Technol. Mater., New Mexico Univ., Albuquerque, NM, USA
Abstract :
External optical feedback effects on quantum dot (QD) laterally loss-coupled (LLC) distributed feedback (DFB) lasers are reported for the first time in this letter. The critical external feedback ratio that causes coherence collapse of the QD DFB is measured to be -14 dB. No spectral broadening at this feedback level is observed within the 0.06-nm resolution of the optical spectrum analyzer (OSA). Self-homodyne measurements also confirm that the rebroadened linewidth of the QD DFB under -14-dB feedback is still much smaller than the feedback-free linewidth. Under 2.5-Gb/s modulation, eye-diagram measurements show that the signal-to-noise ratio starts to degrade at a feedback ratio of -30 dB in the QD LLC-DFB, about 20 dB higher than a typical quantum-well DFB at the same output power and extinction ratio.
Keywords :
III-V semiconductors; distributed feedback lasers; gallium arsenide; laser feedback; laser noise; optical losses; optical modulation; quantum dot lasers; spectral line broadening; (001) GaAs substrate; 2.5 Gbit/s; GaAs; coherence collapse; critical external feedback ratio; external optical feedback effects; eye diagrams; eye-diagram measurements; high external feedback resistance; laterally loss-coupled distributed feedback quantum dot semiconductor lasers; optical spectrum analyzer; rebroadened linewidth; self-homodyne measurements; signal-to-noise ratio degradation; solid source molecular beam epitaxy; spectral broadening; Distributed feedback devices; Electrical resistance measurement; Laser feedback; Optical feedback; Optical losses; Optical modulation; Quantum dot lasers; Semiconductor lasers; Signal resolution; Spectral analysis;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2003.818627