Title :
Treatment of general dependencies in system fault-tree and risk analysis
Author_Institution :
Fortum Power & Heat Oy, Loviisa, Finland
fDate :
9/1/2002 12:00:00 AM
Abstract :
Implicit and explicit methods are described for reliability and risk analysis of systems with dependent or correlated basic events. General rules are presented for modeling any group of n mutually s-dependent events with 2n-1 s-independent events. The probabilities of these virtual events are determined based on the joint probabilities of the original s-dependent events, typically known by s-correlation or conditional probabilities. The transformations preserve the values of all terms (e.g., minimal cut sets), independent of system success criteria. This facilitates general use of ordinary fault-tree computer codes that assume basic events to be s-independent. Explicit basic event probabilities are obtained for calculating the probability of failure on demand of standby safety systems when the s-dependency is caused by scheduling and synchronization of test episodes between n redundant components (1 ⩽ n ⩽ 4), and by statistical variation of failure rates. Interesting "negative probabilities" are encountered in this exercise, mainly due to negative s-correlation between the component unavailabilities with staggered testing. Results obtained for human-error events are useful when the conditional probability to repeat an error is larger than the probability of an error in a single isolated task. Explicit results are obtained for systems with time-related common-cause failures modeled by general multiple failure rates. The impacts of test intervals and test staggering are included. Staggered testing is optimal with an ETR (extra-testing rule), although ETR is not important for 1-out-of-n:G systems. An economic model provides insights into the impacts of various parameters: the optimal test interval increases with increasing redundancy and testing cost, and it decreases with increasing accident cost and initiating event rate. Staggered testing with ETR allows for the longest optimal test intervals. Rules are presented for changing s-dependency probabilities when some component is known to be failed. Current fault-tree quantification tools are not well geared to use the implicit method in spite of the fact that it would simplify the fault-tree construction, reduce the number of cut sets, and allow different types of dependencies or correlations in the analysis. A recommendation is to computerize the implicit method or include it as an option to current codes. It would need only a data table for joint probabilities and the ability to pick-up data from this table whenever two or more of the s-dependent events appear in a term (or a cut set)
Keywords :
fault trees; human factors; risk management; safety systems; 2n-1s-independent events; basic event probabilities; common-cause failure; component unavailabilities; conditional probabilities; conditional probability; correlated basic events; cut sets reduction; dependent events; dependent failure; economic model; explicit methods; extra-testing rule; failure probability; failure rates statistical variation; fault-tree quantification tools; general dependencies treatment; human-error events; implicit methods; increasing accident cost; initiating event rate; joint probabilities; minimal cut sets; multiple failure rates; n mutually s-dependent events; negative probabilities; negative s-correlation; optimal test interval; optimal test intervals; ordinary fault-tree computer codes; original s-dependent events; redundancy; redundant components; s-dependency; scheduling; staggered testing; standby safety systems; standby/safety system; synchronization; system fault-tree analysis; system risk analysis; system success criteria; test intervals; test staggering; testing cost; time-related common-cause failures; virtual events; Accidents; Cost function; Fault trees; Power generation economics; Probability; Processor scheduling; Redundancy; Risk analysis; Safety; System testing;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.2002.801848