DocumentCode :
807611
Title :
Commentary - two reliability war stories
Author :
Yellman, Ted W.
Volume :
51
Issue :
3
fYear :
2002
Firstpage :
380
Lastpage :
381
Abstract :
The author describes his experiences with failure of tone-pulse converter boards used in telephony, and audio-accessory units used in aircraft, and how the problems were overcome. His experience with the failure analysis of CMOS PROM devices is also described.
Keywords :
CMOS integrated circuits; PROM; avionics; failure analysis; reliability; semiconductor device reliability; telephone equipment; CMOS PROM devices; aircraft; audio-accessory units; failure analysis; reliability; telephony; tone-pulse converter boards; Central office; Circuits; Failure analysis; Fuses; PROM; Regulators; Resistors; Switching converters; Telephony; Voltage;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.2002.802887
Filename :
1028414
Link To Document :
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