• DocumentCode
    807776
  • Title

    Effect of contact recombination on the transverse conductivity distribution in photoexcited semiconductor coplanar waveguides

  • Author

    Fickenscher, Th

  • Author_Institution
    Dept. of High-Frequency & Optoelectron. Eng., Univ. of the Federal Armed Forces, Hamburg, Germany
  • Volume
    32
  • Issue
    3
  • fYear
    1996
  • fDate
    2/1/1996 12:00:00 AM
  • Firstpage
    213
  • Lastpage
    215
  • Abstract
    A modified 1-D approximation for the 2-D diffusion-controlled distribution of photoconductivity in the cross-sectional region of illuminated semiconductor coplanar waveguides (CPW) is presented, taking into account contact recombination at the strip and ground plane metallisation
  • Keywords
    coplanar waveguides; electron-hole recombination; photoconductivity; waveguide theory; 1D approximation; 2D diffusion; contact recombination; ground plane metallisation; optical microwave control; photoconductivity; photoexcited semiconductor coplanar waveguide; strip metallisation; transverse conductivity distribution;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19960155
  • Filename
    490808