DocumentCode :
807821
Title :
Digital-domain calibration of multistep analog-to-digital converters
Author :
Lee, Seung-Hoon ; Song, Bang-Sup
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
Volume :
27
Issue :
12
fYear :
1992
fDate :
12/1/1992 12:00:00 AM
Firstpage :
1679
Lastpage :
1688
Abstract :
A digital-domain self-calibration technique, which can directly measure and cancel code errors in multistep conversions, is developed to improve the linearity of multi-step analog-to-digital converters (ADCs). While conventional self-calibration techniques require separate digital-to-analog converters (DACs) for calibration purpose to subtract nonlinearity errors in the analog domain, the proposed digital calibration technique uses add-on digital logic to subtract nonlinearity errors digitally from uncalibrated digital outputs. In a prototype 12-b fully differential two-step ADC implemented using a 2-μm n-well CMOS technology, this technique cancels MOS switch feedthrough, op-amp offsets, and interstage gain errors simultaneously, and improves total harmonic distortion from -64 to -77 dB
Keywords :
CMOS integrated circuits; analogue-digital conversion; calibration; error correction; 2 micron; code errors; digital-domain self-calibration; fully differential two-step ADC; linearity improvement; multistep conversions; n-well CMOS technology; total harmonic distortion; Analog-digital conversion; CMOS logic circuits; CMOS technology; Calibration; Digital-analog conversion; Linearity; Operational amplifiers; Prototypes; Switches; Total harmonic distortion;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.173093
Filename :
173093
Link To Document :
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