DocumentCode :
807839
Title :
A 1.2-μm BiCMOS sample-and-hold circuit with a constant-impedance, slew-enhanced sampling gate
Author :
Wakayama, Myles H. ; Tanimoto, Hiroshi ; Tasai, Takahiro ; Yoshida, Yoshihiro
Author_Institution :
Toshiba Corp., Kawasaki, Japan
Volume :
27
Issue :
12
fYear :
1992
fDate :
12/1/1992 12:00:00 AM
Firstpage :
1697
Lastpage :
1708
Abstract :
A new sampling gate circuit, with dual outputs functioning alternately in the track and hold modes, is integrated in an open-loop sample-and-hold circuit architecture achieving greater than 450-MHz small-signal input bandwidth and 100-MHz maximum sample rate. The sampling gate also incorporates slew enhancement techniques to achieve (+430 V/μs, -510 V/μs) slew rate and features a `built-in´ buffer to maintain constant input impedance for both the track and hold modes, simplifying design of the front-end input buffer. Special on-chip clock generation circuits are used to minimize sampled pedestal (+4 mV). Power dissipation is less than 300 mW, including output driver. Measured harmonics are 58 dB down for a 2 Vp-p 20-MHz sine wave sampled at 100 MHz
Keywords :
BiCMOS integrated circuits; sample and hold circuits; 1.2 micron; 100 MHz; 300 mW; 450 MHz; BiCMOS; constant-impedance; dual outputs; on-chip clock generation circuits; open loop architecture; sample/hold circuit; slew-enhanced sampling gate; track mode; Bandwidth; BiCMOS integrated circuits; CMOS process; Circuit topology; Clocks; Impedance; MOSFETs; Power dissipation; Sampling methods; Switches;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.173095
Filename :
173095
Link To Document :
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