• DocumentCode
    807843
  • Title

    Anomalous Photocurrents in Low-Power Epitaxial Transistors

  • Author

    Gaillard, R. ; Genre, R.

  • Author_Institution
    Institut de Physique Nucléaire, Université Claude Bernard de Lyon, France
  • Volume
    19
  • Issue
    6
  • fYear
    1972
  • Firstpage
    406
  • Lastpage
    413
  • Abstract
    In this paper, we give additional experimental results concerning the anomalous photocurrent problem. Anomalous photocurrents were observed in various epitaxial NPN transistors for different operating modes and bias voltages. It is particularly shor that the devices switch on a stable I(V) characteristic that agrees closely with that given by the avalanche injection mode obtained experimentally with a fast rising high current pulse generator. The triggering mechanism is investigated and emitter injection is found to be a necessary condition. This experimental approach allows us to predict accurately the anomalous photocurrent value without radiation tests and seems to be quite useful in hardening studies.
  • Keywords
    Breakdown voltage; Conductivity; Delay; Electric breakdown; Photoconductivity; Pulse generation; Radiation hardening; Shape; Switches; Testing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1972.4326866
  • Filename
    4326866