DocumentCode :
807843
Title :
Anomalous Photocurrents in Low-Power Epitaxial Transistors
Author :
Gaillard, R. ; Genre, R.
Author_Institution :
Institut de Physique Nucléaire, Université Claude Bernard de Lyon, France
Volume :
19
Issue :
6
fYear :
1972
Firstpage :
406
Lastpage :
413
Abstract :
In this paper, we give additional experimental results concerning the anomalous photocurrent problem. Anomalous photocurrents were observed in various epitaxial NPN transistors for different operating modes and bias voltages. It is particularly shor that the devices switch on a stable I(V) characteristic that agrees closely with that given by the avalanche injection mode obtained experimentally with a fast rising high current pulse generator. The triggering mechanism is investigated and emitter injection is found to be a necessary condition. This experimental approach allows us to predict accurately the anomalous photocurrent value without radiation tests and seems to be quite useful in hardening studies.
Keywords :
Breakdown voltage; Conductivity; Delay; Electric breakdown; Photoconductivity; Pulse generation; Radiation hardening; Shape; Switches; Testing;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1972.4326866
Filename :
4326866
Link To Document :
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