DocumentCode
807843
Title
Anomalous Photocurrents in Low-Power Epitaxial Transistors
Author
Gaillard, R. ; Genre, R.
Author_Institution
Institut de Physique Nucléaire, Université Claude Bernard de Lyon, France
Volume
19
Issue
6
fYear
1972
Firstpage
406
Lastpage
413
Abstract
In this paper, we give additional experimental results concerning the anomalous photocurrent problem. Anomalous photocurrents were observed in various epitaxial NPN transistors for different operating modes and bias voltages. It is particularly shor that the devices switch on a stable I(V) characteristic that agrees closely with that given by the avalanche injection mode obtained experimentally with a fast rising high current pulse generator. The triggering mechanism is investigated and emitter injection is found to be a necessary condition. This experimental approach allows us to predict accurately the anomalous photocurrent value without radiation tests and seems to be quite useful in hardening studies.
Keywords
Breakdown voltage; Conductivity; Delay; Electric breakdown; Photoconductivity; Pulse generation; Radiation hardening; Shape; Switches; Testing;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1972.4326866
Filename
4326866
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