Title :
Neutron Damage Failure Rates for Large Populations
Author :
Holmes, R.R. ; Wilson, D.K. ; Blair, R.R.
Author_Institution :
Bell Laboratories Whippany, New Jersey 07981
Abstract :
The distribution of damage produced by individual 14 MeV neutron events was investigated experimentally. These results were used to establish limits on the probability of failure in large device populations. It was concluded that the damage margin required to allow for extra damaging events is less than 40%, with most systems requiring a margin of less than 15%.
Keywords :
Brightness; Dark current; Diodes; Displays; Electron beams; Electron optics; Neutrons; Optical scattering; Photoconductivity; Silicon;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1972.4326867