DocumentCode :
807867
Title :
Neutron Damage Failure Rates for Large Populations
Author :
Holmes, R.R. ; Wilson, D.K. ; Blair, R.R.
Author_Institution :
Bell Laboratories Whippany, New Jersey 07981
Volume :
19
Issue :
6
fYear :
1972
Firstpage :
414
Lastpage :
417
Abstract :
The distribution of damage produced by individual 14 MeV neutron events was investigated experimentally. These results were used to establish limits on the probability of failure in large device populations. It was concluded that the damage margin required to allow for extra damaging events is less than 40%, with most systems requiring a margin of less than 15%.
Keywords :
Brightness; Dark current; Diodes; Displays; Electron beams; Electron optics; Neutrons; Optical scattering; Photoconductivity; Silicon;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1972.4326867
Filename :
4326867
Link To Document :
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