Title :
A 140-Mb/s, 32-state, radix-4 Viterbi decoder
Author :
Black, Peter J. ; Meng, Teresa H.
Author_Institution :
Inf. Syst. Lab., Stanford Univ., CA, USA
fDate :
12/1/1992 12:00:00 AM
Abstract :
A 140-Mb/s, 32-state, radix-4, R=1/2, eight-level soft-decision Viterbi decoder has been designed and fabricated using 1.2-μm double-metal CMOS. The architecture of the add-compare-select (ACS) array is based on a restructuring of the conventional radix-2 trellis into a radix-4 trellis. Radix-4 units, consisting of four 4-way ACS units, process two stages of the constituent radix-2 trellis per iteration. A four-way ACS circuit achieves an iteration delay 17% longer than comparable two-way ACS circuits, resulting in a factor of 1.7 increase in throughput. A ring-based ACS placement and state metric routing topology achieves an area efficiency comparable to radix-2 designs. In a process referred to as pretrace-back, one stage of lookahead is applied to the trace-back recursion, combining two radix-4 trace-back iterations into a single radix-16 iteration based on 4-b decisions. This allows implementation of trace-back using one compact, single-ported decision memory, organized as a cyclic buffer. A 7.30-mm×8.49-mm chip containing 146000 transistors achieves a radix-4 iteration rate of 70 MHz
Keywords :
CMOS integrated circuits; decoding; integrated logic circuits; shift registers; trellis codes; 1.2 micron; 140 Mbit/s; 32-state decoder; add compare select array architecture; binary shift register trellis; cyclic buffer; double-metal CMOS; eight-level soft-decision Viterbi decoder; iteration delay; lookahead; pretrace-back; radix-16 iteration; radix-4 Viterbi decoder; radix-4 trace-back iterations; radix-4 trellis; single-ported decision memory; state metric routing topology; throughput; trace-back recursion; Algorithm design and analysis; Circuit topology; Convolutional codes; Delay; Demodulation; Error correction codes; Iterative decoding; Routing; Throughput; Viterbi algorithm;
Journal_Title :
Solid-State Circuits, IEEE Journal of