Title :
800 nm WDM Interrogation System for Strain, Temperature, and Refractive Index Sensing Based on Tilted Fiber Bragg Grating
Author :
Suo, Rui ; Chen, Xianfeng ; Zhou, Kaiming ; Zhang, Lin ; Bennion, Ian
Author_Institution :
Photonics Res. Group, Aston Univ., Birmingham
fDate :
7/1/2008 12:00:00 AM
Abstract :
A low-cost high-resolution wavelength-division-multiplexing (WDM) interrogation system operating around 800 nm region with operational bandwidth up to 60 nm and resolution of 12.7 pm utilizing a tilted fiber Bragg grating (TFBG) and a CCD-array detector has been implemented. The system has been evaluated for interrogating fiber Bragg grating based strain, temperature sensors, giving sensitivities of 0.59 pm/muepsiv and 5.6 pm/degC, which are in good agreement with previously reported values. Furthermore, the system has been utilized to detect the refractive index change of sample liquids, demonstrating a capability of measuring index change as small as 10-5. In addition, the vectorial expression of phase match condition and fabrication of TFBG have been discussed.
Keywords :
Bragg gratings; CCD image sensors; fibre optic sensors; refractive index measurement; strain sensors; temperature sensors; wavelength division multiplexing; CCD-array detector; FBG fabrication; WDM interrogation system; phase match condition; refractive index sensing; strain sensing; temperature sensing; tilted fiber Bragg grating; vectorial expression; wavelength 800 nm; wavelength-division-multiplexing; Bragg gratings; Capacitive sensors; Fiber gratings; Optical fibers; Optical frequency conversion; Refractive index; Strain measurement; Temperature sensors; Wavelength division multiplexing; Wavelength measurement; Optical sensing; strain and temperature sensor; tilted fiber Bragg grating (TFBG); wavelength-division-multiplexing (WDM) interrogation system;
Journal_Title :
Sensors Journal, IEEE
DOI :
10.1109/JSEN.2008.926527
