• DocumentCode
    808368
  • Title

    Part 7: analog-to-digital conversion in real-time systems

  • Author

    Fowler, Kim

  • Author_Institution
    Appl. Phys. Lab., Johns Hopkins Univ., Laurel, MD, USA
  • Volume
    6
  • Issue
    3
  • fYear
    2003
  • Firstpage
    58
  • Lastpage
    64
  • Abstract
    This article, as part of a series on real-time systems, covers analog-to-digital converters (ADC). It begins with some basic definitions for converters, then covers some nonideal behaviors of ADCs and how to test them. Finally, it concludes with a brief description of the architecture of ADCs and how they might be used.
  • Keywords
    analogue-digital conversion; circuit testing; network synthesis; real-time systems; ADC architecture; ADC testing; analog-to-digital converters; nonideal ADC behavior; real-time systems; Analog-digital conversion; Apertures; Binary codes; Circuit noise; Instruments; Quantization; Real time systems; Signal to noise ratio; Testing; Transfer functions;
  • fLanguage
    English
  • Journal_Title
    Instrumentation & Measurement Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1094-6969
  • Type

    jour

  • DOI
    10.1109/MIM.2003.1238355
  • Filename
    1238355
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=808368