Dynamic micromagnetic field measurement by stroboscopic electron beam tomography

Author

Shinada, Hiroyuki ; Fukuhara, Satoru ; Seitou, Shigemitsu ; Todokoro, Hideo ; Otomo, Shigekazu ; Takano, Hisashi ; Shiiki, Kazuo

Author_Institution

Hitachi Ltd., Tokyo, Japan

Volume

28

Issue

2

fYear

1992

fDate

3/1/1992 12:00:00 AM

Firstpage

1017

Lastpage

1023

Abstract

A stroboscopic electron beam tomography system for measuring the dynamic micromagnetic field of recording heads is presented. A pulsed electron beam, which is synchronized with the recording head driver, is scanned along the recording head surface from all directions. Integration of the magnetic field intensity along the beam path is calculated from the electron beam deflection angle. Intensity distributions of the dynamic magnetic field are calculated using a tomographic reconstruction algorithm. To obtain enough current even in pulsed electron beam operation, a high-brightness Ti/W thermal field emitter is used. This system was successfully applied in measuring the field distributions of a thin-film recording head, with 0.1 μm spatial resolution and 1 ns time resolution at an operation frequency of 30 MHz

Keywords

computerised tomography; electron beam applications; magnetic field measurement; magnetic heads; magnetic recording; 30 MHz; TiW thermal field emitter; dynamic micromagnetic field measurement; electron beam deflection angle; magnetic field intensity; operation frequency; pulsed electron beam; recording head driver; spatial resolution; stroboscopic electron beam tomography system; thin-film recording head; time resolution; tomographic reconstruction algorithm; Electron beams; Frequency synchronization; Magnetic field measurement; Magnetic heads; Magnetic recording; Micromagnetics; Reconstruction algorithms; Spatial resolution; Surface reconstruction; Tomography;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.123854

Filename

123854