Enhanced columnar structure in CsI layer by substrate patterning

Author

Jing, Tao ; Cho, G. ; Drewery, J. ; Fujieda, I. ; Kaplan, S.N. ; Mireshghi, A. ; Perez-Mendez, V. ; Wildermuth, D.

Author_Institution

Lawrence Berkeley Lab., California Univ., CA, USA

Volume

39

Issue

5

fYear

1992

fDate

10/1/1992 12:00:00 AM

Firstpage

1195

Lastpage

1198

Abstract

An approach to the fabrication of a scintillation layer by forming a sequence of columns of regular, controlled size perpendicular to the substrate, which provides a high light collimation property, thereby improving the resolution of the radiation detection is reported. The preparation and morphology of CsI on these patterned substrates are described. The optical properties of evaporated CsI(TI) layers, such as line spread function, transmission and modulation transfer function, are discussed. The results obtained with 200-μm-thick CsI layers coupled to a linear photodiode array with 20 dots/mm resolution showed that the spatial resolution of CsI(TI) evaporated on patterned substrates was about 75 μm (FWHM, whereas that of CsI(TI) on flat substrates was about 220 μm FWHM. Micrographs taken by scanning electron microscopy revealed that these layers retained the well-defined columnar structure originating from substrate patterns. Adhesion and light transmission of CsI(TI) were also improved by patterning the substrate

Keywords

caesium compounds; scanning electron microscopy; scintillation counters; CsI layer; adhesion; enhanced columnar structure; evaporated CsI(TI); light collimation; light transmission; line spread function; linear photodiode array; modulation transfer function; morphology; optical properties; radiation detection; scanning electron microscopy; scintillation layer; spatial resolution; substrate patterning; Couplings; Lighting control; Morphology; Optical collimators; Optical device fabrication; Optical modulation; Radiation detectors; Size control; Spatial resolution; Transfer functions;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.173177

Filename

173177