DocumentCode
808618
Title
Localisation of devices acting as heat sources in ICs covered entirely by metal layers
Author
Altet, J. ; Salhi, M.A. ; Dilhaire, S. ; Syal, A. ; Ivanov, A.
Author_Institution
Electron. Eng. Dept., Univ. Politecnica de Catalunya, Barcelona, Spain
Volume
39
Issue
20
fYear
2003
Firstpage
1440
Lastpage
1442
Abstract
The feasibility is shown of using the dynamic monitoring of the displacement of the uppermost metal layer due to thermal dilatations to locate devices that generate hot spots in a CMOS IC layout with five levels of metals and with metal fills.
Keywords
CMOS integrated circuits; integrated circuit layout; integrated circuit measurement; integrated circuit reliability; monitoring; CMOS IC; IC layout; dynamic monitoring; heat sources; hot spots; localisation; metal fills; metal layers; thermal dilatations; uppermost metal layer;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:20030907
Filename
1238590
Link To Document